晶诺威科技无源贴片晶振SMD3225电气参数测试说明(英文版)

晶诺威科技无源贴片晶振SMD3225电气参数测试说明(英文版)

晶诺威科技无源贴片晶振SMD3225电气参数测试说明(英文版)说明如下:

MAIN ELECTRICAL SPECIFICATIONS

1. Nominal Frequency

2. Oscillation Mode

3. Load Capacitance

4. Frequency Tolerance

5. Frequency Stability

6. Operating Temperature

7. Aging

8. Drive Level

9. Series Resonant Resistance

10. Shunt Capacitance

11. Insulation Resistance

12. Storage Temperature Range

晶诺威科技无源贴片晶振SMD3225电气参数测试说明(英文版)

Standard atmospheric conditions

Unless otherwise specified, the standard range of atmospheric conditions for making measurement and tests are as follow:

Ambient temperature : 25±5℃

Relative humidity : 40%~70%

If there is any doubt about the results, measurement shall be made within the following limits:

Ambient temperature : 25±3℃

Relative humidity : 40%~70%

Measure equipment

Electrical characteristics measured by S&A250B or equivalent.

Crystal cutting type

The crystal is using AT CUT (thickness shear mode).

Unit Weight:

0.018±0.001 g/pcs

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